Fast diffraction model of an EUV mask based on asymmetric patch data fitting

Research article (Applied Optics, 2023) · cited 10× · AI/ML
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Fast diffraction model of an EUV mask based on asymmetric patch data fitting

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Fast diffraction model of an EUV mask based on asymmetric patch data fitting is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Fast diffraction model of an EUV mask based on asymmetric patch data fitting. Retrieved May 24, 2026, from https://4ort.xyz/entity/fast-diffraction-model-of-an-euv-mask-based-on-asymmetric-patch-data-fitting
MLA “Fast diffraction model of an EUV mask based on asymmetric patch data fitting.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/fast-diffraction-model-of-an-euv-mask-based-on-asymmetric-patch-data-fitting.
BibTeX @misc{4ortxyz_fast-diffraction-model-of-an-euv-mask-based-on-asymmetric-patch-data-fitting_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Fast diffraction model of an EUV mask based on asymmetric patch data fitting}}, year = {2026}, url = {https://4ort.xyz/entity/fast-diffraction-model-of-an-euv-mask-based-on-asymmetric-patch-data-fitting}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Fast diffraction model of an EUV mask based on asymmetric patch data fitting — https://4ort.xyz/entity/fast-diffraction-model-of-an-euv-mask-based-on-asymmetric-patch-data-fitting (retrieved 2026-05-24)

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