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Exploring Active Learning for Semiconductor Defect Segmentation

Research article (2022 IEEE International Conference on Image Processing (ICIP), 2022) · cited 12× · AI/ML
academia openalex:W4308236022
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Exploring Active Learning for Semiconductor Defect Segmentation

Summary

Exploring Active Learning for Semiconductor Defect Segmentation is a scholarly article[1].

Key Facts

  • Exploring Active Learning for Semiconductor Defect Segmentation's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

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Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.

APA 4ort.xyz Knowledge Graph. (2026). Exploring Active Learning for Semiconductor Defect Segmentation. Retrieved May 24, 2026, from https://4ort.xyz/entity/exploring-active-learning-for-semiconductor-defect-segmentation
MLA “Exploring Active Learning for Semiconductor Defect Segmentation.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/exploring-active-learning-for-semiconductor-defect-segmentation.
BibTeX @misc{4ortxyz_exploring-active-learning-for-semiconductor-defect-segmentation_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Exploring Active Learning for Semiconductor Defect Segmentation}}, year = {2026}, url = {https://4ort.xyz/entity/exploring-active-learning-for-semiconductor-defect-segmentation}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Exploring Active Learning for Semiconductor Defect Segmentation — https://4ort.xyz/entity/exploring-active-learning-for-semiconductor-defect-segmentation (retrieved 2026-05-24)

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