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Engineering Breakdown Probability Profile for PDP and DCR Optimization in a SPAD Fabricated in a Standard 55 nm BCD Process
Research article (IEEE Journal of Selected Topics in Quantum Electronics, 2021) · cited 43× · AI/ML
Engineering Breakdown Probability Profile for PDP and DCR Optimization in a SPAD Fabricated in a Standard 55 nm BCD Process
Summary
Engineering Breakdown Probability Profile for PDP and DCR Optimization in a SPAD Fabricated in a Standard 55 nm BCD Process is a scholarly article[1].
Key Facts
Engineering Breakdown Probability Profile for PDP and DCR Optimization in a SPAD Fabricated in a Standard 55 nm BCD Process's instance of is recorded as scholarly article[2].
References
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APA4ort.xyz Knowledge Graph. (2026). Engineering Breakdown Probability Profile for PDP and DCR Optimization in a SPAD Fabricated in a Standard 55 nm BCD Process. Retrieved May 24, 2026, from https://4ort.xyz/entity/engineering-breakdown-probability-profile-for-pdp-and-dcr-optimization-in-a-spad-fabricated-in-a-standard-55-nm-bcd-proc
MLA“Engineering Breakdown Probability Profile for PDP and DCR Optimization in a SPAD Fabricated in a Standard 55 nm BCD Process.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/engineering-breakdown-probability-profile-for-pdp-and-dcr-optimization-in-a-spad-fabricated-in-a-standard-55-nm-bcd-proc.
BibTeX@misc{4ortxyz_engineering-breakdown-probability-profile-for-pdp-and-dcr-optimization-in-a-spad-fabricated-in-a-standard-55-nm-bcd-proc_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Engineering Breakdown Probability Profile for PDP and DCR Optimization in a SPAD Fabricated in a Standard 55 nm BCD Process}}, year = {2026}, url = {https://4ort.xyz/entity/engineering-breakdown-probability-profile-for-pdp-and-dcr-optimization-in-a-spad-fabricated-in-a-standard-55-nm-bcd-proc}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Engineering Breakdown Probability Profile for PDP and DCR Optimization in a SPAD Fabricated in a Standard 55 nm BCD Process — https://4ort.xyz/entity/engineering-breakdown-probability-profile-for-pdp-and-dcr-optimization-in-a-spad-fabricated-in-a-standard-55-nm-bcd-proc (retrieved 2026-05-24)
