Home ›
Entities
› academia
› EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan
EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan
Research article (Quality and Reliability Engineering International, 2021) · cited 23× · AI/ML
EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan
Summary
EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan is a scholarly article[1].
Key Facts
EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan's instance of is recorded as scholarly article[2].
References
Programmatic citations — every numbered marker resolves to a verifiable graph row below.
Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.
APA4ort.xyz Knowledge Graph. (2026). EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan. Retrieved May 24, 2026, from https://4ort.xyz/entity/embased-likelihood-inference-for-oneshot-device-test-data-under-lognormal-lifetimes-and-the-optimal-design-of-a-csalt-pl
MLA“EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/embased-likelihood-inference-for-oneshot-device-test-data-under-lognormal-lifetimes-and-the-optimal-design-of-a-csalt-pl.
BibTeX@misc{4ortxyz_embased-likelihood-inference-for-oneshot-device-test-data-under-lognormal-lifetimes-and-the-optimal-design-of-a-csalt-pl_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan}}, year = {2026}, url = {https://4ort.xyz/entity/embased-likelihood-inference-for-oneshot-device-test-data-under-lognormal-lifetimes-and-the-optimal-design-of-a-csalt-pl}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan — https://4ort.xyz/entity/embased-likelihood-inference-for-oneshot-device-test-data-under-lognormal-lifetimes-and-the-optimal-design-of-a-csalt-pl (retrieved 2026-05-24)
