Electronic characterization of plasma-thick n-type silicon using neural networks and photoacoustic response

Research article (Optical and Quantum Electronics, 2022) · cited 10× · AI/ML
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Electronic characterization of plasma-thick n-type silicon using neural networks and photoacoustic response

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Electronic characterization of plasma-thick n-type silicon using neural networks and photoacoustic response is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Electronic characterization of plasma-thick n-type silicon using neural networks and photoacoustic response. Retrieved May 24, 2026, from https://4ort.xyz/entity/electronic-characterization-of-plasma-thick-n-type-silicon-using-neural-networks-and-photoacoustic-response
MLA “Electronic characterization of plasma-thick n-type silicon using neural networks and photoacoustic response.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/electronic-characterization-of-plasma-thick-n-type-silicon-using-neural-networks-and-photoacoustic-response.
BibTeX @misc{4ortxyz_electronic-characterization-of-plasma-thick-n-type-silicon-using-neural-networks-and-photoacoustic-response_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Electronic characterization of plasma-thick n-type silicon using neural networks and photoacoustic response}}, year = {2026}, url = {https://4ort.xyz/entity/electronic-characterization-of-plasma-thick-n-type-silicon-using-neural-networks-and-photoacoustic-response}, note = {Accessed: 2026-05-24}}
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