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Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation
Research article (Solid-State Electronics, 2015) · cited 24× · AI/ML
Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation
Summary
Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation is a scholarly article[1].
Key Facts
Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation. Retrieved May 24, 2026, from https://4ort.xyz/entity/electrical-characterization-of-random-telegraph-noise-in-fully-depleted-silicon-on-insulator-mosfets-under-extended-temp
MLA“Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/electrical-characterization-of-random-telegraph-noise-in-fully-depleted-silicon-on-insulator-mosfets-under-extended-temp.
BibTeX@misc{4ortxyz_electrical-characterization-of-random-telegraph-noise-in-fully-depleted-silicon-on-insulator-mosfets-under-extended-temp_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation}}, year = {2026}, url = {https://4ort.xyz/entity/electrical-characterization-of-random-telegraph-noise-in-fully-depleted-silicon-on-insulator-mosfets-under-extended-temp}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation — https://4ort.xyz/entity/electrical-characterization-of-random-telegraph-noise-in-fully-depleted-silicon-on-insulator-mosfets-under-extended-temp (retrieved 2026-05-24)
