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Effective DC fault models and testing approach for open defects in analog circuits

Research article (2016 IEEE International Test Conference (ITC), 2016) · cited 23× · AI/ML
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Effective DC fault models and testing approach for open defects in analog circuits

Summary

Effective DC fault models and testing approach for open defects in analog circuits is a scholarly article[1].

Key Facts

  • Effective DC fault models and testing approach for open defects in analog circuits's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Effective DC fault models and testing approach for open defects in analog circuits. Retrieved May 24, 2026, from https://4ort.xyz/entity/effective-dc-fault-models-and-testing-approach-for-open-defects-in-analog-circuits
MLA “Effective DC fault models and testing approach for open defects in analog circuits.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/effective-dc-fault-models-and-testing-approach-for-open-defects-in-analog-circuits.
BibTeX @misc{4ortxyz_effective-dc-fault-models-and-testing-approach-for-open-defects-in-analog-circuits_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Effective DC fault models and testing approach for open defects in analog circuits}}, year = {2026}, url = {https://4ort.xyz/entity/effective-dc-fault-models-and-testing-approach-for-open-defects-in-analog-circuits}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Effective DC fault models and testing approach for open defects in analog circuits — https://4ort.xyz/entity/effective-dc-fault-models-and-testing-approach-for-open-defects-in-analog-circuits (retrieved 2026-05-24)

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