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Detection of Defects in Printed Circuit Boards by Clustering the Etalon and Defected Samples
Research article (2020 IEEE 15th International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET), 2020) · cited 15× · AI/ML
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APA4ort.xyz Knowledge Graph. (2026). Detection of Defects in Printed Circuit Boards by Clustering the Etalon and Defected Samples. Retrieved May 24, 2026, from https://4ort.xyz/entity/detection-of-defects-in-printed-circuit-boards-by-clustering-the-etalon-and-defected-samples
MLA“Detection of Defects in Printed Circuit Boards by Clustering the Etalon and Defected Samples.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/detection-of-defects-in-printed-circuit-boards-by-clustering-the-etalon-and-defected-samples.
BibTeX@misc{4ortxyz_detection-of-defects-in-printed-circuit-boards-by-clustering-the-etalon-and-defected-samples_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Detection of Defects in Printed Circuit Boards by Clustering the Etalon and Defected Samples}}, year = {2026}, url = {https://4ort.xyz/entity/detection-of-defects-in-printed-circuit-boards-by-clustering-the-etalon-and-defected-samples}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Detection of Defects in Printed Circuit Boards by Clustering the Etalon and Defected Samples — https://4ort.xyz/entity/detection-of-defects-in-printed-circuit-boards-by-clustering-the-etalon-and-defected-samples (retrieved 2026-05-24)
