Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits

Research article (IET Science Measurement & Technology, 2017) · cited 14× · AI/ML
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Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits

Summary

Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits is a scholarly article[1].

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  • Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits. Retrieved May 24, 2026, from https://4ort.xyz/entity/design-and-application-of-a-mobile-miniature-current-probe-for-analysing-the-cause-of-emi-noise-in-ic-circuits
MLA “Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/design-and-application-of-a-mobile-miniature-current-probe-for-analysing-the-cause-of-emi-noise-in-ic-circuits.
BibTeX @misc{4ortxyz_design-and-application-of-a-mobile-miniature-current-probe-for-analysing-the-cause-of-emi-noise-in-ic-circuits_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits}}, year = {2026}, url = {https://4ort.xyz/entity/design-and-application-of-a-mobile-miniature-current-probe-for-analysing-the-cause-of-emi-noise-in-ic-circuits}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits — https://4ort.xyz/entity/design-and-application-of-a-mobile-miniature-current-probe-for-analysing-the-cause-of-emi-noise-in-ic-circuits (retrieved 2026-05-24)

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