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Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images
Research article (Advanced Structural and Chemical Imaging, 2016) · cited 26× · AI/ML
Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images
Summary
Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images is a scholarly article[1].
Key Facts
Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images's instance of is recorded as scholarly article[2].
References
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APA4ort.xyz Knowledge Graph. (2026). Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images. Retrieved May 24, 2026, from https://4ort.xyz/entity/deceleration-of-probe-beam-by-stage-bias-potential-improves-resolution-of-serial-block-face-scanning-electron-microscopi
MLA“Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/deceleration-of-probe-beam-by-stage-bias-potential-improves-resolution-of-serial-block-face-scanning-electron-microscopi.
BibTeX@misc{4ortxyz_deceleration-of-probe-beam-by-stage-bias-potential-improves-resolution-of-serial-block-face-scanning-electron-microscopi_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images}}, year = {2026}, url = {https://4ort.xyz/entity/deceleration-of-probe-beam-by-stage-bias-potential-improves-resolution-of-serial-block-face-scanning-electron-microscopi}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images — https://4ort.xyz/entity/deceleration-of-probe-beam-by-stage-bias-potential-improves-resolution-of-serial-block-face-scanning-electron-microscopi (retrieved 2026-05-24)
