Correlation of actinic blank inspection and experimental phase defect printability on NXE3x00 EUV scanner

Research article (Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE, 2015) · cited 10× · AI/ML
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Correlation of actinic blank inspection and experimental phase defect printability on NXE3x00 EUV scanner

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Correlation of actinic blank inspection and experimental phase defect printability on NXE3x00 EUV scanner is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Correlation of actinic blank inspection and experimental phase defect printability on NXE3x00 EUV scanner. Retrieved May 24, 2026, from https://4ort.xyz/entity/correlation-of-actinic-blank-inspection-and-experimental-phase-defect-printability-on-nxe3x00-euv-scanner
MLA “Correlation of actinic blank inspection and experimental phase defect printability on NXE3x00 EUV scanner.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/correlation-of-actinic-blank-inspection-and-experimental-phase-defect-printability-on-nxe3x00-euv-scanner.
BibTeX @misc{4ortxyz_correlation-of-actinic-blank-inspection-and-experimental-phase-defect-printability-on-nxe3x00-euv-scanner_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Correlation of actinic blank inspection and experimental phase defect printability on NXE3x00 EUV scanner}}, year = {2026}, url = {https://4ort.xyz/entity/correlation-of-actinic-blank-inspection-and-experimental-phase-defect-printability-on-nxe3x00-euv-scanner}, note = {Accessed: 2026-05-24}}
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