Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class

Research article (IEEE Transactions on Semiconductor Manufacturing, 2019) · cited 288× · AI/ML
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Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class

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Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class. Retrieved May 24, 2026, from https://4ort.xyz/entity/convolutional-neural-network-for-wafer-surface-defect-classification-and-the-detection-of-unknown-defect-class
MLA “Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/convolutional-neural-network-for-wafer-surface-defect-classification-and-the-detection-of-unknown-defect-class.
BibTeX @misc{4ortxyz_convolutional-neural-network-for-wafer-surface-defect-classification-and-the-detection-of-unknown-defect-class_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class}}, year = {2026}, url = {https://4ort.xyz/entity/convolutional-neural-network-for-wafer-surface-defect-classification-and-the-detection-of-unknown-defect-class}, note = {Accessed: 2026-05-24}}
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