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Compact Modeling of Dynamic MOSFET Degradation Due to Hot-Electrons

Research article (IEEE Transactions on Device and Materials Reliability, 2017) · cited 11× · AI/ML
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Compact Modeling of Dynamic MOSFET Degradation Due to Hot-Electrons

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Compact Modeling of Dynamic MOSFET Degradation Due to Hot-Electrons is a scholarly article[1].

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  • Compact Modeling of Dynamic MOSFET Degradation Due to Hot-Electrons's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Compact Modeling of Dynamic MOSFET Degradation Due to Hot-Electrons. Retrieved May 24, 2026, from https://4ort.xyz/entity/compact-modeling-of-dynamic-mosfet-degradation-due-to-hot-electrons
MLA “Compact Modeling of Dynamic MOSFET Degradation Due to Hot-Electrons.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/compact-modeling-of-dynamic-mosfet-degradation-due-to-hot-electrons.
BibTeX @misc{4ortxyz_compact-modeling-of-dynamic-mosfet-degradation-due-to-hot-electrons_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Compact Modeling of Dynamic MOSFET Degradation Due to Hot-Electrons}}, year = {2026}, url = {https://4ort.xyz/entity/compact-modeling-of-dynamic-mosfet-degradation-due-to-hot-electrons}, note = {Accessed: 2026-05-24}}
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