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Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction
Research article (Nano Letters, 2015) · cited 41× · AI/ML
Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction
Summary
Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction is a scholarly article[1].
Key Facts
Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction's instance of is recorded as scholarly article[2].
References
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APA4ort.xyz Knowledge Graph. (2026). Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction. Retrieved May 24, 2026, from https://4ort.xyz/entity/combining-2-nm-spatial-resolution-and-0-02-precision-for-deformation-mapping-of-semiconductor-specimens-in-a-transmissio
MLA“Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/combining-2-nm-spatial-resolution-and-0-02-precision-for-deformation-mapping-of-semiconductor-specimens-in-a-transmissio.
BibTeX@misc{4ortxyz_combining-2-nm-spatial-resolution-and-0-02-precision-for-deformation-mapping-of-semiconductor-specimens-in-a-transmissio_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction}}, year = {2026}, url = {https://4ort.xyz/entity/combining-2-nm-spatial-resolution-and-0-02-precision-for-deformation-mapping-of-semiconductor-specimens-in-a-transmissio}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction — https://4ort.xyz/entity/combining-2-nm-spatial-resolution-and-0-02-precision-for-deformation-mapping-of-semiconductor-specimens-in-a-transmissio (retrieved 2026-05-24)
