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Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise
Research article (2020 IEEE International Reliability Physics Symposium (IRPS), 2020) · cited 12× · AI/ML
Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise
Summary
Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise is a scholarly article[1].
Key Facts
Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise. Retrieved May 24, 2026, from https://4ort.xyz/entity/circuit-reliability-analysis-of-rram-based-logic-in-memory-crossbar-architectures-including-line-parasitic-effects-varia
MLA“Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/circuit-reliability-analysis-of-rram-based-logic-in-memory-crossbar-architectures-including-line-parasitic-effects-varia.
BibTeX@misc{4ortxyz_circuit-reliability-analysis-of-rram-based-logic-in-memory-crossbar-architectures-including-line-parasitic-effects-varia_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise}}, year = {2026}, url = {https://4ort.xyz/entity/circuit-reliability-analysis-of-rram-based-logic-in-memory-crossbar-architectures-including-line-parasitic-effects-varia}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise — https://4ort.xyz/entity/circuit-reliability-analysis-of-rram-based-logic-in-memory-crossbar-architectures-including-line-parasitic-effects-varia (retrieved 2026-05-24)
