Chemical recognition based on high-accuracy matching factors as per time-of-flight–secondary-ion mass spectrometry: Application to trace cosmetic residues in human forensics

Research article (Microchemical Journal, 2020) · cited 13× · AI/ML
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Chemical recognition based on high-accuracy matching factors as per time-of-flight–secondary-ion mass spectrometry: Application to trace cosmetic residues in human forensics

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Chemical recognition based on high-accuracy matching factors as per time-of-flight–secondary-ion mass spectrometry: Application to trace cosmetic residues in human forensics is a scholarly article[1].

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  • Chemical recognition based on high-accuracy matching factors as per time-of-flight–secondary-ion mass spectrometry: Application to trace cosmetic residues in human forensics's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Chemical recognition based on high-accuracy matching factors as per time-of-flight–secondary-ion mass spectrometry: Application to trace cosmetic residues in human forensics. Retrieved May 24, 2026, from https://4ort.xyz/entity/chemical-recognition-based-on-high-accuracy-matching-factors-as-per-time-of-flightsecondary-ion-mass-spectrometry-applic
MLA “Chemical recognition based on high-accuracy matching factors as per time-of-flight–secondary-ion mass spectrometry: Application to trace cosmetic residues in human forensics.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/chemical-recognition-based-on-high-accuracy-matching-factors-as-per-time-of-flightsecondary-ion-mass-spectrometry-applic.
BibTeX @misc{4ortxyz_chemical-recognition-based-on-high-accuracy-matching-factors-as-per-time-of-flightsecondary-ion-mass-spectrometry-applic_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Chemical recognition based on high-accuracy matching factors as per time-of-flight–secondary-ion mass spectrometry: Application to trace cosmetic residues in human forensics}}, year = {2026}, url = {https://4ort.xyz/entity/chemical-recognition-based-on-high-accuracy-matching-factors-as-per-time-of-flightsecondary-ion-mass-spectrometry-applic}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Chemical recognition based on high-accuracy matching factors as per time-of-flight–secondary-ion mass spectrometry: Application to trace cosmetic residues in human forensics — https://4ort.xyz/entity/chemical-recognition-based-on-high-accuracy-matching-factors-as-per-time-of-flightsecondary-ion-mass-spectrometry-applic (retrieved 2026-05-24)

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