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APA4ort.xyz Knowledge Graph. (2026). Characterization of Single Defects in Ultrascaled MoS<sub><b>2</b></sub> Field-Effect Transistors. Retrieved May 24, 2026, from https://4ort.xyz/entity/characterization-of-single-defects-in-ultrascaled-mos-sub-b-2-b-sub-field-effect-transistors
MLA“Characterization of Single Defects in Ultrascaled MoS<sub><b>2</b></sub> Field-Effect Transistors.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/characterization-of-single-defects-in-ultrascaled-mos-sub-b-2-b-sub-field-effect-transistors.
BibTeX@misc{4ortxyz_characterization-of-single-defects-in-ultrascaled-mos-sub-b-2-b-sub-field-effect-transistors_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Characterization of Single Defects in Ultrascaled MoS<sub><b>2</b></sub> Field-Effect Transistors}}, year = {2026}, url = {https://4ort.xyz/entity/characterization-of-single-defects-in-ultrascaled-mos-sub-b-2-b-sub-field-effect-transistors}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Characterization of Single Defects in Ultrascaled MoS<sub><b>2</b></sub> Field-Effect Transistors — https://4ort.xyz/entity/characterization-of-single-defects-in-ultrascaled-mos-sub-b-2-b-sub-field-effect-transistors (retrieved 2026-05-24)