Application of Clustering Filter for Noise and Outlier Suppression in Optical Measurement of Structured Surfaces

Research article (IEEE Transactions on Instrumentation and Measurement, 2020) · cited 26× · AI/ML
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Application of Clustering Filter for Noise and Outlier Suppression in Optical Measurement of Structured Surfaces

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Application of Clustering Filter for Noise and Outlier Suppression in Optical Measurement of Structured Surfaces is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Application of Clustering Filter for Noise and Outlier Suppression in Optical Measurement of Structured Surfaces. Retrieved May 24, 2026, from https://4ort.xyz/entity/application-of-clustering-filter-for-noise-and-outlier-suppression-in-optical-measurement-of-structured-surfaces
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BibTeX @misc{4ortxyz_application-of-clustering-filter-for-noise-and-outlier-suppression-in-optical-measurement-of-structured-surfaces_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Application of Clustering Filter for Noise and Outlier Suppression in Optical Measurement of Structured Surfaces}}, year = {2026}, url = {https://4ort.xyz/entity/application-of-clustering-filter-for-noise-and-outlier-suppression-in-optical-measurement-of-structured-surfaces}, note = {Accessed: 2026-05-24}}
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