Analysis on Process Variation Effect of 3D NAND Flash Memory Cell through Machine Learning Model

Research article (2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 2020) · cited 16× · AI/ML
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Analysis on Process Variation Effect of 3D NAND Flash Memory Cell through Machine Learning Model

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Analysis on Process Variation Effect of 3D NAND Flash Memory Cell through Machine Learning Model is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Analysis on Process Variation Effect of 3D NAND Flash Memory Cell through Machine Learning Model. Retrieved May 24, 2026, from https://4ort.xyz/entity/analysis-on-process-variation-effect-of-3d-nand-flash-memory-cell-through-machine-learning-model
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BibTeX @misc{4ortxyz_analysis-on-process-variation-effect-of-3d-nand-flash-memory-cell-through-machine-learning-model_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Analysis on Process Variation Effect of 3D NAND Flash Memory Cell through Machine Learning Model}}, year = {2026}, url = {https://4ort.xyz/entity/analysis-on-process-variation-effect-of-3d-nand-flash-memory-cell-through-machine-learning-model}, note = {Accessed: 2026-05-24}}
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