Home ›
Entities
› academia
› Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances
Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances
Research article (Journal of Electronic Testing, 2016) · cited 17× · AI/ML
Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances
Summary
Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances is a scholarly article[1].
Key Facts
Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances's instance of is recorded as scholarly article[2].
References
Programmatic citations — every numbered marker resolves to a verifiable graph row below.
Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.
APA4ort.xyz Knowledge Graph. (2026). Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances. Retrieved May 24, 2026, from https://4ort.xyz/entity/analog-circuit-test-point-selection-incorporating-discretization-based-fuzzification-and-extended-fault-dictionary-to-ha
MLA“Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/analog-circuit-test-point-selection-incorporating-discretization-based-fuzzification-and-extended-fault-dictionary-to-ha.
BibTeX@misc{4ortxyz_analog-circuit-test-point-selection-incorporating-discretization-based-fuzzification-and-extended-fault-dictionary-to-ha_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances}}, year = {2026}, url = {https://4ort.xyz/entity/analog-circuit-test-point-selection-incorporating-discretization-based-fuzzification-and-extended-fault-dictionary-to-ha}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances — https://4ort.xyz/entity/analog-circuit-test-point-selection-incorporating-discretization-based-fuzzification-and-extended-fault-dictionary-to-ha (retrieved 2026-05-24)
