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AI classification of wafer map defect patterns by using dual-channel convolutional neural network

Research article (Engineering Failure Analysis, 2021) · cited 39× · AI/ML
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AI classification of wafer map defect patterns by using dual-channel convolutional neural network

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AI classification of wafer map defect patterns by using dual-channel convolutional neural network is a scholarly article[1].

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  • AI classification of wafer map defect patterns by using dual-channel convolutional neural network's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). AI classification of wafer map defect patterns by using dual-channel convolutional neural network. Retrieved May 24, 2026, from https://4ort.xyz/entity/ai-classification-of-wafer-map-defect-patterns-by-using-dual-channel-convolutional-neural-network
MLA “AI classification of wafer map defect patterns by using dual-channel convolutional neural network.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/ai-classification-of-wafer-map-defect-patterns-by-using-dual-channel-convolutional-neural-network.
BibTeX @misc{4ortxyz_ai-classification-of-wafer-map-defect-patterns-by-using-dual-channel-convolutional-neural-network_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{AI classification of wafer map defect patterns by using dual-channel convolutional neural network}}, year = {2026}, url = {https://4ort.xyz/entity/ai-classification-of-wafer-map-defect-patterns-by-using-dual-channel-convolutional-neural-network}, note = {Accessed: 2026-05-24}}
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