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Accurate Picture of Cycling Degradation in HfO<sub>2</sub>-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis
Research article (2021 IEEE International Electron Devices Meeting (IEDM), 2021) · cited 37× · AI/ML
Accurate Picture of Cycling Degradation in HfO2-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis
Summary
Accurate Picture of Cycling Degradation in HfO2-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis is a scholarly article[1].
Key Facts
Accurate Picture of Cycling Degradation in HfO2-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis's instance of is recorded as scholarly article[2].
References
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APA4ort.xyz Knowledge Graph. (2026). Accurate Picture of Cycling Degradation in HfO<sub>2</sub>-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis. Retrieved May 24, 2026, from https://4ort.xyz/entity/accurate-picture-of-cycling-degradation-in-hfo-sub-2-sub-fefet-based-on-charge-trapping-dynamics-revealed-by-fast-charge
MLA“Accurate Picture of Cycling Degradation in HfO<sub>2</sub>-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/accurate-picture-of-cycling-degradation-in-hfo-sub-2-sub-fefet-based-on-charge-trapping-dynamics-revealed-by-fast-charge.
BibTeX@misc{4ortxyz_accurate-picture-of-cycling-degradation-in-hfo-sub-2-sub-fefet-based-on-charge-trapping-dynamics-revealed-by-fast-charge_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Accurate Picture of Cycling Degradation in HfO<sub>2</sub>-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis}}, year = {2026}, url = {https://4ort.xyz/entity/accurate-picture-of-cycling-degradation-in-hfo-sub-2-sub-fefet-based-on-charge-trapping-dynamics-revealed-by-fast-charge}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Accurate Picture of Cycling Degradation in HfO<sub>2</sub>-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis — https://4ort.xyz/entity/accurate-picture-of-cycling-degradation-in-hfo-sub-2-sub-fefet-based-on-charge-trapping-dynamics-revealed-by-fast-charge (retrieved 2026-05-24)
