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A Variational Autoencoder Enhanced Deep Learning Model for Wafer Defect Imbalanced Classification

Research article (IEEE Transactions on Components Packaging and Manufacturing Technology, 2021) · cited 42× · AI/ML
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A Variational Autoencoder Enhanced Deep Learning Model for Wafer Defect Imbalanced Classification

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A Variational Autoencoder Enhanced Deep Learning Model for Wafer Defect Imbalanced Classification is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). A Variational Autoencoder Enhanced Deep Learning Model for Wafer Defect Imbalanced Classification. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-variational-autoencoder-enhanced-deep-learning-model-for-wafer-defect-imbalanced-classification
MLA “A Variational Autoencoder Enhanced Deep Learning Model for Wafer Defect Imbalanced Classification.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-variational-autoencoder-enhanced-deep-learning-model-for-wafer-defect-imbalanced-classification.
BibTeX @misc{4ortxyz_a-variational-autoencoder-enhanced-deep-learning-model-for-wafer-defect-imbalanced-classification_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A Variational Autoencoder Enhanced Deep Learning Model for Wafer Defect Imbalanced Classification}}, year = {2026}, url = {https://4ort.xyz/entity/a-variational-autoencoder-enhanced-deep-learning-model-for-wafer-defect-imbalanced-classification}, note = {Accessed: 2026-05-24}}
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