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A Thru-Halfthru-Short De-Embedding Method for Millimeter-Wave On-Wafer HBT Characterization

Research article (IEEE Electron Device Letters, 2017) · cited 20× · AI/ML
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A Thru-Halfthru-Short De-Embedding Method for Millimeter-Wave On-Wafer HBT Characterization

Summary

A Thru-Halfthru-Short De-Embedding Method for Millimeter-Wave On-Wafer HBT Characterization is a scholarly article[1].

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Direct Wikidata claims

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). A Thru-Halfthru-Short De-Embedding Method for Millimeter-Wave On-Wafer HBT Characterization. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-thru-halfthru-short-de-embedding-method-for-millimeter-wave-on-wafer-hbt-characterization
MLA “A Thru-Halfthru-Short De-Embedding Method for Millimeter-Wave On-Wafer HBT Characterization.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-thru-halfthru-short-de-embedding-method-for-millimeter-wave-on-wafer-hbt-characterization.
BibTeX @misc{4ortxyz_a-thru-halfthru-short-de-embedding-method-for-millimeter-wave-on-wafer-hbt-characterization_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A Thru-Halfthru-Short De-Embedding Method for Millimeter-Wave On-Wafer HBT Characterization}}, year = {2026}, url = {https://4ort.xyz/entity/a-thru-halfthru-short-de-embedding-method-for-millimeter-wave-on-wafer-hbt-characterization}, note = {Accessed: 2026-05-24}}
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