A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty

Research article (IET Power Electronics, 2023) · cited 14× · AI/ML
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A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty

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A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-remaining-useful-life-prediction-method-of-sic-mosfet-considering-failure-threshold-uncertainty
MLA “A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-remaining-useful-life-prediction-method-of-sic-mosfet-considering-failure-threshold-uncertainty.
BibTeX @misc{4ortxyz_a-remaining-useful-life-prediction-method-of-sic-mosfet-considering-failure-threshold-uncertainty_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty}}, year = {2026}, url = {https://4ort.xyz/entity/a-remaining-useful-life-prediction-method-of-sic-mosfet-considering-failure-threshold-uncertainty}, note = {Accessed: 2026-05-24}}
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