A Practical Inductor Loss Testing Scheme and Device With High Frequency Pulsewidth Modulation Excitations

Research article (IEEE Transactions on Industrial Electronics, 2020) · cited 25× · AI/ML
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A Practical Inductor Loss Testing Scheme and Device With High Frequency Pulsewidth Modulation Excitations

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A Practical Inductor Loss Testing Scheme and Device With High Frequency Pulsewidth Modulation Excitations is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). A Practical Inductor Loss Testing Scheme and Device With High Frequency Pulsewidth Modulation Excitations. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-practical-inductor-loss-testing-scheme-and-device-with-high-frequency-pulsewidth-modulation-excitations
MLA “A Practical Inductor Loss Testing Scheme and Device With High Frequency Pulsewidth Modulation Excitations.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-practical-inductor-loss-testing-scheme-and-device-with-high-frequency-pulsewidth-modulation-excitations.
BibTeX @misc{4ortxyz_a-practical-inductor-loss-testing-scheme-and-device-with-high-frequency-pulsewidth-modulation-excitations_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A Practical Inductor Loss Testing Scheme and Device With High Frequency Pulsewidth Modulation Excitations}}, year = {2026}, url = {https://4ort.xyz/entity/a-practical-inductor-loss-testing-scheme-and-device-with-high-frequency-pulsewidth-modulation-excitations}, note = {Accessed: 2026-05-24}}
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