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A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics
Research article (Microelectronics Reliability, 2021) · cited 13× · AI/ML
A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics
Summary
A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics is a scholarly article[1].
Key Facts
A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-novel-material-detection-method-using-femtosecond-laser-confocal-imaging-and-image-processing-enabling-endpointing-in-
MLA“A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-novel-material-detection-method-using-femtosecond-laser-confocal-imaging-and-image-processing-enabling-endpointing-in-.
BibTeX@misc{4ortxyz_a-novel-material-detection-method-using-femtosecond-laser-confocal-imaging-and-image-processing-enabling-endpointing-in-_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics}}, year = {2026}, url = {https://4ort.xyz/entity/a-novel-material-detection-method-using-femtosecond-laser-confocal-imaging-and-image-processing-enabling-endpointing-in-}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics — https://4ort.xyz/entity/a-novel-material-detection-method-using-femtosecond-laser-confocal-imaging-and-image-processing-enabling-endpointing-in- (retrieved 2026-05-24)
