A New Test Point Selection Method for Analog Continuous Parameter Fault

Research article (Journal of Electronic Testing, 2017) · cited 13× · AI/ML
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A New Test Point Selection Method for Analog Continuous Parameter Fault

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A New Test Point Selection Method for Analog Continuous Parameter Fault is a scholarly article[1].

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  • A New Test Point Selection Method for Analog Continuous Parameter Fault's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). A New Test Point Selection Method for Analog Continuous Parameter Fault. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-new-test-point-selection-method-for-analog-continuous-parameter-fault
MLA “A New Test Point Selection Method for Analog Continuous Parameter Fault.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-new-test-point-selection-method-for-analog-continuous-parameter-fault.
BibTeX @misc{4ortxyz_a-new-test-point-selection-method-for-analog-continuous-parameter-fault_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A New Test Point Selection Method for Analog Continuous Parameter Fault}}, year = {2026}, url = {https://4ort.xyz/entity/a-new-test-point-selection-method-for-analog-continuous-parameter-fault}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): A New Test Point Selection Method for Analog Continuous Parameter Fault — https://4ort.xyz/entity/a-new-test-point-selection-method-for-analog-continuous-parameter-fault (retrieved 2026-05-24)

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