Home ›
Entities
› academia
› A New IC Solder Joint Inspection Method for an Automatic Optical Inspection System Based on an Improved Visual Background Extraction Algorithm
A New IC Solder Joint Inspection Method for an Automatic Optical Inspection System Based on an Improved Visual Background Extraction Algorithm
Research article (IEEE Transactions on Components Packaging and Manufacturing Technology, 2015) · cited 68× · AI/ML
A New IC Solder Joint Inspection Method for an Automatic Optical Inspection System Based on an Improved Visual Background Extraction Algorithm
Summary
A New IC Solder Joint Inspection Method for an Automatic Optical Inspection System Based on an Improved Visual Background Extraction Algorithm is a scholarly article[1].
Key Facts
A New IC Solder Joint Inspection Method for an Automatic Optical Inspection System Based on an Improved Visual Background Extraction Algorithm's instance of is recorded as scholarly article[2].
References
Programmatic citations — every numbered marker resolves to a verifiable graph row below.
Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.
APA4ort.xyz Knowledge Graph. (2026). A New IC Solder Joint Inspection Method for an Automatic Optical Inspection System Based on an Improved Visual Background Extraction Algorithm. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-new-ic-solder-joint-inspection-method-for-an-automatic-optical-inspection-system-based-on-an-improved-visual-backgroun
MLA“A New IC Solder Joint Inspection Method for an Automatic Optical Inspection System Based on an Improved Visual Background Extraction Algorithm.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-new-ic-solder-joint-inspection-method-for-an-automatic-optical-inspection-system-based-on-an-improved-visual-backgroun.
BibTeX@misc{4ortxyz_a-new-ic-solder-joint-inspection-method-for-an-automatic-optical-inspection-system-based-on-an-improved-visual-backgroun_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A New IC Solder Joint Inspection Method for an Automatic Optical Inspection System Based on an Improved Visual Background Extraction Algorithm}}, year = {2026}, url = {https://4ort.xyz/entity/a-new-ic-solder-joint-inspection-method-for-an-automatic-optical-inspection-system-based-on-an-improved-visual-backgroun}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): A New IC Solder Joint Inspection Method for an Automatic Optical Inspection System Based on an Improved Visual Background Extraction Algorithm — https://4ort.xyz/entity/a-new-ic-solder-joint-inspection-method-for-an-automatic-optical-inspection-system-based-on-an-improved-visual-backgroun (retrieved 2026-05-24)