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A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT
Research article (2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020) · cited 15× · AI/ML
A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT
Summary
A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT is a scholarly article[1].
Key Facts
A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-multiple-target-test-generation-method-for-gate-exhaustive-faults-to-reduce-the-number-of-test-patterns-using-partial-
MLA“A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-multiple-target-test-generation-method-for-gate-exhaustive-faults-to-reduce-the-number-of-test-patterns-using-partial-.
BibTeX@misc{4ortxyz_a-multiple-target-test-generation-method-for-gate-exhaustive-faults-to-reduce-the-number-of-test-patterns-using-partial-_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT}}, year = {2026}, url = {https://4ort.xyz/entity/a-multiple-target-test-generation-method-for-gate-exhaustive-faults-to-reduce-the-number-of-test-patterns-using-partial-}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT — https://4ort.xyz/entity/a-multiple-target-test-generation-method-for-gate-exhaustive-faults-to-reduce-the-number-of-test-patterns-using-partial- (retrieved 2026-05-24)
