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A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes
Research article (IEEE Transactions on Semiconductor Manufacturing, 2020) · cited 189× · AI/ML
A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes
Summary
A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes is a scholarly article[1].
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A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-deep-convolutional-neural-network-for-wafer-defect-identification-on-an-imbalanced-dataset-in-semiconductor-manufactur
MLA“A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-deep-convolutional-neural-network-for-wafer-defect-identification-on-an-imbalanced-dataset-in-semiconductor-manufactur.
BibTeX@misc{4ortxyz_a-deep-convolutional-neural-network-for-wafer-defect-identification-on-an-imbalanced-dataset-in-semiconductor-manufactur_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes}}, year = {2026}, url = {https://4ort.xyz/entity/a-deep-convolutional-neural-network-for-wafer-defect-identification-on-an-imbalanced-dataset-in-semiconductor-manufactur}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes — https://4ort.xyz/entity/a-deep-convolutional-neural-network-for-wafer-defect-identification-on-an-imbalanced-dataset-in-semiconductor-manufactur (retrieved 2026-05-24)
