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A Deep Convolutional Neural Network-Based Multi-Class Image Classification for Automatic Wafer Map Failure Recognition in Semiconductor Manufacturing
Research article (Applied Sciences, 2021) · cited 48× · AI/ML
A Deep Convolutional Neural Network-Based Multi-Class Image Classification for Automatic Wafer Map Failure Recognition in Semiconductor Manufacturing
Summary
A Deep Convolutional Neural Network-Based Multi-Class Image Classification for Automatic Wafer Map Failure Recognition in Semiconductor Manufacturing is a scholarly article[1].
Key Facts
A Deep Convolutional Neural Network-Based Multi-Class Image Classification for Automatic Wafer Map Failure Recognition in Semiconductor Manufacturing's instance of is recorded as scholarly article[2].
References
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APA4ort.xyz Knowledge Graph. (2026). A Deep Convolutional Neural Network-Based Multi-Class Image Classification for Automatic Wafer Map Failure Recognition in Semiconductor Manufacturing. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-deep-convolutional-neural-network-based-multi-class-image-classification-for-automatic-wafer-map-failure-recognition-i
MLA“A Deep Convolutional Neural Network-Based Multi-Class Image Classification for Automatic Wafer Map Failure Recognition in Semiconductor Manufacturing.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-deep-convolutional-neural-network-based-multi-class-image-classification-for-automatic-wafer-map-failure-recognition-i.
BibTeX@misc{4ortxyz_a-deep-convolutional-neural-network-based-multi-class-image-classification-for-automatic-wafer-map-failure-recognition-i_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A Deep Convolutional Neural Network-Based Multi-Class Image Classification for Automatic Wafer Map Failure Recognition in Semiconductor Manufacturing}}, year = {2026}, url = {https://4ort.xyz/entity/a-deep-convolutional-neural-network-based-multi-class-image-classification-for-automatic-wafer-map-failure-recognition-i}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): A Deep Convolutional Neural Network-Based Multi-Class Image Classification for Automatic Wafer Map Failure Recognition in Semiconductor Manufacturing — https://4ort.xyz/entity/a-deep-convolutional-neural-network-based-multi-class-image-classification-for-automatic-wafer-map-failure-recognition-i (retrieved 2026-05-24)
