A 2-Transistor-2-Capacitor Ferroelectric Edge Compute-in-Memory Scheme With Disturb-Free Inference and High Endurance

Research article (IEEE Electron Device Letters, 2023) · cited 17× · AI/ML
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A 2-Transistor-2-Capacitor Ferroelectric Edge Compute-in-Memory Scheme With Disturb-Free Inference and High Endurance

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A 2-Transistor-2-Capacitor Ferroelectric Edge Compute-in-Memory Scheme With Disturb-Free Inference and High Endurance is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). A 2-Transistor-2-Capacitor Ferroelectric Edge Compute-in-Memory Scheme With Disturb-Free Inference and High Endurance. Retrieved May 24, 2026, from https://4ort.xyz/entity/a-2-transistor-2-capacitor-ferroelectric-edge-compute-in-memory-scheme-with-disturb-free-inference-and-high-endurance
MLA “A 2-Transistor-2-Capacitor Ferroelectric Edge Compute-in-Memory Scheme With Disturb-Free Inference and High Endurance.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/a-2-transistor-2-capacitor-ferroelectric-edge-compute-in-memory-scheme-with-disturb-free-inference-and-high-endurance.
BibTeX @misc{4ortxyz_a-2-transistor-2-capacitor-ferroelectric-edge-compute-in-memory-scheme-with-disturb-free-inference-and-high-endurance_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{A 2-Transistor-2-Capacitor Ferroelectric Edge Compute-in-Memory Scheme With Disturb-Free Inference and High Endurance}}, year = {2026}, url = {https://4ort.xyz/entity/a-2-transistor-2-capacitor-ferroelectric-edge-compute-in-memory-scheme-with-disturb-free-inference-and-high-endurance}, note = {Accessed: 2026-05-24}}
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