# Yield prediction in semiconductor manufacturing using an AI-based cascading classification system

> Research article (2020 IEEE International Conference on Electro Information Technology (EIT), 2020) · cited 13× · AI/ML

**Wikidata**: [openalex:W3091391475](https://www.wikidata.org/wiki/openalex:W3091391475)  
**Source**: https://4ort.xyz/entity/yield-prediction-in-semiconductor-manufacturing-using-an-ai-based-cascading-classification-system