# WDP-BNN: Efficient wafer defect pattern classification via binarized neural network

> Research article (Integration, 2022) · cited 12× · AI/ML

**Wikidata**: [openalex:W4223475101](https://www.wikidata.org/wiki/openalex:W4223475101)  
**Source**: https://4ort.xyz/entity/wdp-bnn-efficient-wafer-defect-pattern-classification-via-binarized-neural-network