# Wafer Surface Defect Detection Based On Improved YOLOv3 Network

> Research article (2020 5th International Conference on Mechanical, Control and Computer Engineering (ICMCCE), 2020) · cited 10× · AI/ML

**Wikidata**: [openalex:W3161825902](https://www.wikidata.org/wiki/openalex:W3161825902)  
**Source**: https://4ort.xyz/entity/wafer-surface-defect-detection-based-on-improved-yolov3-network