# Wafer map failure pattern recognition based on deep convolutional neural network

> Research article (Expert Systems with Applications, 2022) · cited 49× · AI/ML

**Wikidata**: [openalex:W4286687376](https://www.wikidata.org/wiki/openalex:W4286687376)  
**Source**: https://4ort.xyz/entity/wafer-map-failure-pattern-recognition-based-on-deep-convolutional-neural-network