# Wafer map defect recognition based on multi-scale feature fusion and attention spatial pyramid pooling

> Research article (Journal of Intelligent Manufacturing, 2023) · cited 34× · AI/ML

**Wikidata**: [openalex:W4388425154](https://www.wikidata.org/wiki/openalex:W4388425154)  
**Source**: https://4ort.xyz/entity/wafer-map-defect-recognition-based-on-multi-scale-feature-fusion-and-attention-spatial-pyramid-pooling