# Wafer Map Defect Recognition Based on Deep Transfer Learning

> Research article (2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2019) · cited 26× · AI/ML

**Wikidata**: [openalex:W3003758715](https://www.wikidata.org/wiki/openalex:W3003758715)  
**Source**: https://4ort.xyz/entity/wafer-map-defect-recognition-based-on-deep-transfer-learning