# Wafer map defect recognition based on deep transfer learning-based densely connected convolutional network and deep forest

> Research article (Engineering Applications of Artificial Intelligence, 2021) · cited 43× · AI/ML

**Wikidata**: [openalex:W3195021195](https://www.wikidata.org/wiki/openalex:W3195021195)  
**Source**: https://4ort.xyz/entity/wafer-map-defect-recognition-based-on-deep-transfer-learning-based-densely-connected-convolutional-network-and-deep-fore