# Wafer Map Defect Pattern Recognition using Imbalanced Datasets

> Research article (2022 13th International Conference on Information, Intelligence, Systems & Applications (IISA), 2022) · cited 10× · AI/ML

**Wikidata**: [openalex:W4312899448](https://www.wikidata.org/wiki/openalex:W4312899448)  
**Source**: https://4ort.xyz/entity/wafer-map-defect-pattern-recognition-using-imbalanced-datasets