# Wafer map defect pattern detection method based on improved attention mechanism

> Research article (Expert Systems with Applications, 2023) · cited 40× · AI/ML

**Wikidata**: [openalex:W4378648357](https://www.wikidata.org/wiki/openalex:W4378648357)  
**Source**: https://4ort.xyz/entity/wafer-map-defect-pattern-detection-method-based-on-improved-attention-mechanism