# Wafer Edge Yield Prediction Using a Combined Long Short-Term Memory and Feed- Forward Neural Network Model for Semiconductor Manufacturing

> Research article (IEEE Access, 2020) · cited 35× · AI/ML

**Wikidata**: [openalex:W3109909800](https://www.wikidata.org/wiki/openalex:W3109909800)  
**Source**: https://4ort.xyz/entity/wafer-edge-yield-prediction-using-a-combined-long-short-term-memory-and-feed-forward-neural-network-model-for-semiconduc