# Wafer defect patterns recognition based on OPTICS and multi-label classification

> Research article (2016 IEEE Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC), 2016) · cited 64× · AI/ML

**Wikidata**: [openalex:W2593609447](https://www.wikidata.org/wiki/openalex:W2593609447)  
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