# Wafer Defect Pattern Labeling and Recognition Using Semi-Supervised Learning

> Research article (IEEE Transactions on Semiconductor Manufacturing, 2022) · cited 27× · AI/ML

**Wikidata**: [openalex:W4225518185](https://www.wikidata.org/wiki/openalex:W4225518185)  
**Source**: https://4ort.xyz/entity/wafer-defect-pattern-labeling-and-recognition-using-semi-supervised-learning