# Wafer Defect Localization and Classification Using Deep Learning Techniques

> Research article (IEEE Access, 2022) · cited 58× · AI/ML

**Wikidata**: [openalex:W4225818162](https://www.wikidata.org/wiki/openalex:W4225818162)  
**Source**: https://4ort.xyz/entity/wafer-defect-localization-and-classification-using-deep-learning-techniques