# Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101

> Research article (International Journal of Systems Assurance Engineering and Management, 2023) · cited 13× · AI/ML

**Wikidata**: [openalex:W4390228453](https://www.wikidata.org/wiki/openalex:W4390228453)  
**Source**: https://4ort.xyz/entity/wafer-defect-identification-with-optimal-hyper-parameter-tuning-of-support-vector-machine-using-the-deep-feature-of-resn