# W-Band Noise Characterization with Back-Gate Effects for Advanced 22nm FDSOI mm-Wave MOSFETs

> Research article (2020 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), 2020) · cited 10× · AI/ML

**Wikidata**: [openalex:W3091816956](https://www.wikidata.org/wiki/openalex:W3091816956)  
**Source**: https://4ort.xyz/entity/w-band-noise-characterization-with-back-gate-effects-for-advanced-22nm-fdsoi-mm-wave-mosfets