# Verifying the accuracy of 2x-Thru de-embedding for unsymmetrical test fixtures

> Research article (2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS), 2017) · cited 10× · AI/ML

**Wikidata**: [openalex:W2795376604](https://www.wikidata.org/wiki/openalex:W2795376604)  
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