# Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits

> Research article (IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2021) · cited 10× · AI/ML

**Wikidata**: [openalex:W3121036806](https://www.wikidata.org/wiki/openalex:W3121036806)  
**Source**: https://4ort.xyz/entity/variation-aware-delay-fault-testing-for-carbon-nanotube-fet-circuits